The Transportation Security Administration (TSA) and American Airlines are to test a new computed tomography (CT) scanner at the Terminal 8 security checkpoint at New York’s John F Kennedy International Airport (JFK).
CT checkpoint technology is an enhancement to today’s 2D x-ray technology scanning equipment, which is used at the majority of security checkpoints worldwide. Because CT technology is 3D, this new checkpoint technology has the potential to provide better visibility and allow the operator to rotate the bag’s image 360° to show the contents of carry-on items at every angle.
CT provides the capability to virtually see beyond unwanted clutter and greatly enhances the ability to visually inspect the contents of carry-on bags for prohibited items.
This results in more effective security screening at the security checkpoint. In the future, CT could offer the opportunity for passengers to leave liquids, gels and aerosols, as well as laptops, in their carry-on bags at all times.
David Pekoske, TSA administrator, said, “Use of CT technology substantially improves TSA’s threat detection capability at a checkpoint. This partnership will allow us to deploy new technology quickly and see an immediate improvement in security effectiveness.”
TSA expects the new CT technology will begin operation at JFK in late July. CT technology is also being tested at airport security checkpoints in Phoenix, Arizona, and Boston, Massachusetts.
José Freig, chief security officer at American Airlines, commented, “At American, we are always looking at ways to invest in technology that raises the bar on global aviation security while improving the customer experience.
“Our partnership with Analogic Corporation and the TSA will continue to transform aviation security by bringing state-of-the-art CT technology to the security checkpoint.”